CVE-2018-13888 | Date: (C)2019-02-13 (M)2023-12-22 |
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
CVSS Score and Metrics +CVSS Score and Metrics -CVSS V3 Severity: | CVSS V2 Severity: |
CVSS Score : 7.8 | CVSS Score : 7.2 |
Exploit Score: 1.8 | Exploit Score: 3.9 |
Impact Score: 5.9 | Impact Score: 10.0 |
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CVSS V3 Metrics: | CVSS V2 Metrics: |
Attack Vector: LOCAL | Access Vector: LOCAL |
Attack Complexity: LOW | Access Complexity: LOW |
Privileges Required: LOW | Authentication: NONE |
User Interaction: NONE | Confidentiality: COMPLETE |
Scope: UNCHANGED | Integrity: COMPLETE |
Confidentiality: HIGH | Availability: COMPLETE |
Integrity: HIGH | |
Availability: HIGH | |
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